Mick Micro Measurement (Shenzhen) Measurement Technology Co., Ltd
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    19107014181
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    Area A, 6th Floor, Building 11, Hengchangrong Industrial Park, Huangtian Community, Bao'an District, Shenzhen, China
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ETIPD Leeb hardness tester
The ETIPD series integrated Leeb hardness tester is a Leeb hardness tester designed with an impact device and signal acquisition display integrated. T
Product details

Characteristics of ETIPD Leeb Hardness Test


  • Integrated design, compact and easy to carry

  • Built in gravity acceleration sensor, automatic compensation for directional data

  • Scale conversion HB, HRB, HRC, HV, HSD

  • Data storage management, can connect to PC software, wireless printing function

  • Powered by lithium batteries, can be recharged repeatedly

  • Applicable standards:GB/T17394,GB/T1172,ASTM A956 & DIN 50156


ETIPD Leeb Hardness Tester Specification


display range

170~960HL

precision

±4HL

Testing direction

Automatically identify the direction of impact

monitor

0.96-inch 128 * 64 dot matrix LCD

printer

Built in wireless printing function, wireless printer optional

Computer communication software

Standard computer communication software for uploading data to the computer for easy analysis and storage

battery

3.7V 110mAh lithium battery

charger DC5V/1A

working environment

Temperature: -10~+40 ℃

Humidity: 20%~85%

storage environment

Temperature: -30~+80 ℃

Humidity: 5%~95%

size

147* 35*22 mm

weight

100g

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